We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.

叙述了次条纹积分干涉计量的原理，仅用一幅光载频干涉条纹图获取全部位相信息。

It has been proved that this method is fit for the parallel linable fringes and the interferograms with the arbitrary closed loop fringe pattern.

该方法具有精度高、抗干扰的特点，不仅适用于平行直线型条纹图像，而且对含闭合条纹的复杂干涉图像同样适用。